HONG KONG HAOCHIP TRADING CO., LIMITED

    Specialty Logic

    制造商 Series Package/Case Packaging Product Status Logic Type Supply Voltage Number of Bits Operating Temperature Grade Qualification Mounting Type Supplier Device Package


















































































































































































































































































































































































































































































































































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    Photo Mfr. Part # Availability Price Quantity Datasheet Series Package/Case Packaging Product Status Logic Type Supply Voltage Number of Bits Operating Temperature Grade Qualification Mounting Type Supplier Device Package
    SNJ54ABT8245FK

    SNJ54ABT8245FK

    SCAN TEST DEVICES WITH OCTAL BUS

    Texas Instruments

    4,499 -
    RFQ
    SNJ54ABT8245FK

    Datasheet

    54ABT 28-CLCC Tube Active Scan Test Device with Bus Transceivers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Surface Mount 28-LCCC (11.43x11.43)
    SN74S1052NS

    SN74S1052NS

    DIODE ARRAY SCHOTT 7V 50MA 20SO

    Texas Instruments

    4,641 1.14
    RFQ

    -

    74S 20-SOIC (0.209", 5.30mm Width) Tube Active Schottky Barrier Diode Bus-Termination Array - 16 0°C ~ 70°C - - Surface Mount 20-SO
    JM38510/07802BEA

    JM38510/07802BEA

    LOOK-AHEAD CARRY GENERATORS 16-C

    Texas Instruments

    4,710 -
    RFQ
    JM38510/07802BEA

    Datasheet

    54S 16-CDIP (0.300", 7.62mm) Tube Active Look-ahead Carry Generator 4.5V ~ 5.5V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
    SNJ54BCT8244AFK

    SNJ54BCT8244AFK

    SCAN TEST DEVICES WITH OCTAL BUF

    Texas Instruments

    4,625 53.31
    RFQ
    SNJ54BCT8244AFK

    Datasheet

    54BCT 28-CLCC Tube Active Scan Test Device with Buffers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Surface Mount 28-LCCC (11.43x11.43)
    CD54HC297F3A

    CD54HC297F3A

    HIGH SPEED CMOS LOGIC DIGITAL PH

    Texas Instruments

    3,998 -
    RFQ
    CD54HC297F3A

    Datasheet

    54HC 16-CDIP (0.300", 7.62mm) Tube Active Digital Phase-Locked-Loop Filters 2V ~ 6V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
    SNJ54ABT8652JT

    SNJ54ABT8652JT

    SCAN TEST DEVICES WITH OCTAL BUS

    Texas Instruments

    1,114 -
    RFQ

    -

    54ABT 28-CDIP (0.300", 7.62mm) Tube Active Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Through Hole 28-CDIP
    M38510/31202BEA

    M38510/31202BEA

    4-BIT BINARY FULL ADDERS WITH FA

    Texas Instruments

    4,577 -
    RFQ
    M38510/31202BEA

    Datasheet

    54LS 16-CDIP (0.300", 7.62mm) Tube Active Binary Full Adder with Fast Carry 4.5V ~ 5.5V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
    CD54ACT283F3A

    CD54ACT283F3A

    4-BIT BINARY FULL ADDER WITH FAS

    Texas Instruments

    2,545 -
    RFQ
    CD54ACT283F3A

    Datasheet

    54ACT 16-CDIP (0.300", 7.62mm) Tube Active Binary Full Adder with Fast Carry 4.5V ~ 5.5V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
    SNJ54BCT8245AFK

    SNJ54BCT8245AFK

    SCAN TEST DEVICES WITH OCTAL BUS

    Texas Instruments

    1,992 -
    RFQ
    SNJ54BCT8245AFK

    Datasheet

    54BCT 28-CLCC Tube Active Scan Test Device with Bus Transceivers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Surface Mount 28-LCCC (11.43x11.43)
    SNJ54BCT8244AJT

    SNJ54BCT8244AJT

    SCAN TEST DEVICES WITH OCTAL BUF

    Texas Instruments

    1,324 -
    RFQ
    SNJ54BCT8244AJT

    Datasheet

    54BCT 24-CDIP (0.300", 7.62mm) Tube Active Scan Test Device with Buffers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Through Hole 24-CDIP
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